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Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms


MA-tek FTP

Sustainability report

EFA of IC Product Case Study

Cases Study I - IDDQ & ESD Fail



Cases Study II - Isb Leakage Fail



Cases Study III - Gate Leakage Fail



Micro Pits on Si substrate, which induced Dielectrics Breakdown in the channel region