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Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms


MA-tek FTP

Sustainability report

Wafer Level, Chip Level

LED structure analysis

(a)X-ray image;(b)SEM image;(c)TEM image;(d)TEM image ;(e)TEM image;(f)HAADF image;(g)Optical Profile


(a)Display search : IEK/ITRI

 (b)SIMS doping profile/depth profile