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Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms


MA-tek FTP

Sustainability report

Metal Diffusion in Glass




Detailed interface by TEM & Quick-check by SEM/EDS



Precise depth profiling by SIMS

  • Diffusion depth was found to be around 12um by SIMS, which was reconfirmed by SEM/EDS analysis.
  • The interface between glass and metal can be defined by Co & Ni concentration.
  • SIMS detection sensitivities is better than other analysis instruments, the diffusion depth could be observed more deeply.