[Seminar] MA-tek Chip Power, Smart Driving New Future (Shanghai Venue)
First, we are very honored to invite Liu Lin, Director of the Shanghai Integrated Circuit Industry Association, to give a speech. Director Liu's remarks pointed out the major trends and directions of industry development, and also opened the seminar. Next, Dr. Xie Yongfen, Chairman of MA-tek, took the stage to share MA-tek's strategic layout in the field of semiconductor testing and analysis.
The content of this seminar was rich and full of valuable information. The topics covered include:
- Surrounding AI leading failure analysis
- Reliability stress verification of automotive power semiconductors
- ASIC Design & Foundry Service Total Solution
- Technology and methods for protecting semiconductor intellectual property rights
- Advanced material analysis in the analysis applications of automotive electronics
- Surface analysis in the analysis applications of smart driving automotive components
Multiple instructors from MA-tek combined practical cases and cutting-edge technologies to share insights in an accessible manner, providing attendees with a feast of knowledge, while also engaging in in-depth exchanges with guests, sparking intellectual discussions.
The successful holding of this seminar not only deepened the communication and cooperation between MA-tek and industry colleagues but also injected new vitality into the collaborative development of the smart driving and semiconductor testing industries. In the future, MA-tek will continue to uphold the principles of professionalism, innovation, openness, and sharing, continuously driving industry progress through technology, and we look forward to seeing you next time!
