Material Analysis
Material Analysis is ResearchThe structure, composition, and properties of materialsto obtain detailed information in the field of science and technology,The main purpose is to understand the behavior of materials during manufacturing, development, and troubleshooting.MA-tek is the most comprehensive materials analysis electronic and electrical laboratory in the country, combining consulting and advisory services to accurately and correctly provide various testing services that meet customers' analytical needs in the research and development of electronic products and the development of new material structures and processes. The main equipment items include:
- Field Emission Transmission Electron Microscopes ( FE-TEM )
- Focused Ion Beams (FIB) For circuit editing and cross-sectioning,equipped with EBSD, CL.
- Auger For film composition analysis or contamination analysis.
- SIMS (magnetic sector, quadrupole) / TOF-SIMS
- Field Emission Scanning Electron Microscopes (FE-SEM)
- X-ray Photoelectron (XPS) For organic & inorganic composition analy
MA-tek integrates diverse material analysis technologies, covering atomic-level imaging analysis to ppt-level trace component detection. Depending on the sample type and analysis requirements, it provides complete solutions such as structural observation, element identification, surface analysis, and chemical composition testing.
