Sample preparation is the most basic and indispensable step before analysis and testing. Through physical or chemical methods such as grinding, extraction, filtration, and dilution, the sample is adjusted to a state suitable for measurement. Regardless of whether it is solid, liquid, or even semiconductor components, different pretreatments are required according to the material characteristics. These steps may seem trivial, but they directly affect the reliability of subsequent analysis results. After the IC design is completed, whether for functional testing, reliability testing, or failure analysis, the samples must be properly prepared before measurements can begin. The precision of the pretreatment will influence the accuracy of the tests and whether defects can be easily identified. Therefore, sample preparation is not just a part of the process, but a critical step that determines success or failure.