XRF X-ray fluorescence spectrometer

X-ray Fluorescence (XRF)XRF) is a non-destructive elemental analysis technology,When the sample is irradiated with high-energy X-rays or gamma rays, the inner-shell electrons of the atoms in the material are excited and leave their original orbitals, creating electron vacancies. When the outer-shell electrons fill these vacancies, they release characteristic X-rays with specific energies.Characteristic X-ray (X-ray Fluorescence)。

The characteristic X-rays produced by different elements have different energies or wavelengths. Therefore, by detecting these signals with a detector, it is possible to determine the presence of elements in the sample.Element types and contents,XRF analysis hasFast, non-contact, non-destructivethe characteristics, can be used for elemental analysis of various materials, such as:metal materials,electronic components, glass and ceramics,building materials,geochemical samples.

In addition, Portable XRF analyzerRapid testing can be conducted directly on-site, especially suitable for large or immobile samples, such as in environmental monitoring, material inspection, and product quality control.

• Rapid Element Analysiscan measure trace metals or thin film components in small areas

• RoHS testing modewith shape, thickness, and position correction functions to improve measurement accuracy

• Automatic selection of standard curves and element analysis modes

• Plastic Material Dedicated Analysis Softwareto reduce errors caused by differences in sample size and shape

• Built-in halogen-free Br and Cl calibration curves, enabling precise quantification

• Automatic Spectrum Analysis Systemprovides qualitative and quantitative analysis of elements

• Can Complete thickness measurement of multi-layer coatings such as Au/Ni/Cu in about 10 seconds.