Electrical measurement is the primary step in the process of failure analysis and reliability assessment.The first Step, through non-destructive measurement methods, can quickly determine whether there are abnormalities in the components, and effectively narrow down the scope of subsequent material analysis, structural analysis, or destructive analysis, improving overall analysis efficiency and accuracy.

The purpose of electrical measurement is toVerify and quantify the key electrical parameters and operational characteristics of semiconductor electronic components.including voltage-current (I-V), capacitance-voltage (C-V) characteristic curves, as well as measurements of resistance, capacitance, inductance, and signal waveforms. Through precise electrical measurements, it can assist engineers in determining whether the components meet design specifications and further analyze the underlying abnormal behavior.Failure modes and fault mechanismsas an important basis for subsequent failure analysis (FA), reliability verification, or process improvement.

MA-tek chip level measurement capability |Support hard probe and soft probe detection, corresponding to diverse analysis needs.

MA-tek can provideChip Level electrical measurement servicessupporting hard probe and soft probe detection methods, among which soft probe is particularly suitable forElectrical verification and confirmation after circuit repairMeasurement operations are paired with high precision.Probe Station and customized probe holdersIt can simultaneously perform multi-point contact (up to six pins) to enhance measurement efficiency and stability; the Probe Station is integrated.Laser Cutting Systemto assist in accurately locating measurement areas, supporting the needs for electrical analysis of small structures or localized areas.

MA-tek measurement equipment and system configuration |Covering a complete range of electrical measurements from low current to high power.

MA-tek has established a complete set of electrical measurement equipment that can meet the testing needs from low leakage components to high power devices. The main equipment includes:

• Semiconductor Parameter Analyzer

  • HP 4156C

  • Keysight B1500A

• High Power Device Analyzer

  • Keysight B1506A (±3 kV / 20 A)

• High Voltage Power Supply

  • Keithley 2410

  • Keithley 2290 (5 kV / 5 mA)

• Multiple outputs and general power supplies

• Digital Multimeter (DMM) and Oscilloscope

• DC Electronic Load

• Function Generator

Through the integrated configuration between devices, DC, AC, and dynamic electrical measurements can be flexibly performed.