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Composition & Material Analysis

Component and material analysis is an important foundation for product development, quality verification, failure analysis, and process optimization. Through high-sensitivity surface analysis, micro-area analysis, and material structure identification techniques, it is possible to deeply analyze the elemental composition, chemical bonding, oxidation state, crystal structure, phase composition, and material distribution of metals, semiconductors, ceramics, polymers, films, coatings, and composite materials.

 

Through precise elemental analysis and chemical structure analysis, it is possible not only to confirm whether the material formulation and composition meet specifications, but also to further identify trace contaminants, abnormal precipitates, corrosion products, interfacial reactions, material degradation, and process residues. For localized defects or small abnormal areas, micro-area material analysis technology can also target specific locations for testing, helping to clarify the relationship between differences in material composition and product anomalies.

 

Complete analysis results of components and materials can serve as an important basis for raw material verification, foreign matter identification, competitor analysis, process condition adjustments, product reliability assessment, and failure cause determination, assisting enterprises in quickly identifying root causes of problems, reducing trial and error costs, and enhancing product quality, process stability, and R&D efficiency.

  • Application Scenarios

    • Surface contamination and foreign object analysis (Organic / Metal contamination)
    • Analysis of Film Material Composition and Interlayer Diffusion
    • Chemical Bonding and Oxidation State Determination
    • Crystal structure and stress/strain analysis
  • Core Values

    • High sensitivity elemental analysis (ppm~ppb level)
    • Can analyze the composition distribution in surface and depth directions.
    • Establish the root cause basis for material failure and process abnormalities.
Service Examples

SIMS Secondary Ion Mass Spectrometer

XPS X-ray Photoelectron Spectrometer

XRF X-ray fluorescence spectrometer

AES OJ Electronics Energy Spectrum Analyzer

FTIR Fourier Transform Infrared Spectroscopy

HRXRD High-Resolution X-ray Diffraction Analyzer

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