Chat with us, powered by LiveChat

Package Structure

The packaging structure and appearance are the first line of defense in assessing process quality. Through the measurement of appearance, dimensions, and structure, packaging deformation, warping, or structural abnormalities can be detected early, preventing the problem from escalating further.

 

Optical Microscope

 

IC-Testing-3

 

Non Contact 3D Surface Profiler

 

Applications 

  • Flatness, surface roughness, step height, deformation and waviness
  • 2-D and 3-D profile

 

Advantages 

  • Accurate, fast and no sample preparation is needed
  • An extremely wide range of surface heights is capable to be profiled. (~180μm)
  • The benefits of optical surface profilometry include
    - Excellent height resolution
    - High measurement speed
    - Ability to perform non-contact measurements of delicate surfaces

 

Surface defects characterization

  • (a) OP; (b) SEM; (c) LED; (d) Au Bump

  • 100 μm Bump Profiler

  • 20 μm Bump Profile

SEM Imaging

 

 

Privacy Preference Center

We use cookies to allow our website to function properly, personalize content and advertisements, provide social media features, and analyze traffic. We also share information about your usage of our website with social media, advertising, and analytics partners.

View Privacy Policy

Manage Consent Settings

Necessary Cookies

Always Enabled

The operation of the website relies on these cookies, and you cannot disable them in the system. These cookies are usually set based on the actions you take (i.e., service requests), such as setting privacy preferences, logging in, or filling out forms. You can configure your browser to block or prompt you about these cookies, but this may result in certain website functionalities not working.