MA-tek advances to SEMICON Japan 2025
The global semiconductor annual event SEMICON Japan 2025 will take place from December 17-19 at Tokyo Big Sight! MA-tek will meet you at booth E6807!
MA-tek showcases comprehensive analysis capabilities.
At this exhibition, MA-tek will showcase a one-stop analysis capability: from advanced process and packaging structure analysis, power component validation, to automotive-grade reliability testing and failure analysis; covering nano-level material composition analysis, electrical failure localization, reverse engineering, and AEC-Q related measurements. Through comprehensive and in-depth analysis capabilities, we assist clients in identifying and managing key risks early in the R&D and production phases, enhancing the control over process implementation, and ensuring a more stable yield in mass production.
Globalization × Localization
MA-tek has established comprehensive localized analysis services in Hokkaido, Kumamoto, and Nagoya, and the Nagoya Second Laboratory (Lab II) will be operational in 2026, adding multiple advanced failure analysis equipment to further enhance the support speed and technical depth in the Japanese market.
Event Information
- Event time: 2025/12/17 (Wed) – 12/19 (Fri)
- Location: Tokyo Big Sight
- Booth number: E6807
MA-tek will participate in SEMICON Japan 2025 at Big Sight, Tokyo, Japan from December 17 to December 19, showcasing its one-stop analytical capabilities with a deep commitment to Japan and readiness for action.
Deeply rooted in Japan, local combat effectiveness.
From the stable operation of the laboratories in Nagoya, Kumamoto, and Hokkaido, to the upcoming launch of the Nagoya Second Plant in 2026, MA-tek continues to expand its analytical capabilities in Japan, allowing Japanese customers to receive immediate and comprehensive technical support locally.
The practical value of one-stop analysis energy.
From advanced process structure analysis and nano-level failure localization, all the way to a complete solution for automotive-grade reliability testing, there is no need for segmented outsourcing or repeated communication; the problem can be resolved from "understanding" to "verification" in one go!
Cross-technology integration, shorten decision-making time
Integrating materials, structures, electrical properties, and reliability analysis to assist customers in quickly identifying the root causes of failures, making critical judgments, and shortening the bottleneck period from R&D to mass production.
A little surprise at the exhibition: During the exhibition, the mysterious guest Kumamon also made a special appearance at the MA-tek booth, adding a lot of energy to the scene~
