The automotive industry is accelerating towards electrification, intelligence, and automation, including functions such as power control, battery management, in-vehicle communication, sensing systems, and ADAS/self-driving algorithms. The core of these systems relies on electronic components that can maintain stability under high temperature differences, high humidity, high vibration, and long-term operation.
Compared to general consumer electronics, automotive components must pass more stringent and longer cycles of reliability and safety verification. Components in actual vehicle driving environments experience complex stresses such as thermal fatigue, material stress, packaging aging, electromagnetic interference, power cycling, and mechanical vibration. Any minor weakness can affect product lifespan and even driving safety.
MA-tek possesses integrated analysis capabilities in electrical, structural, thermal behavior, and reliability, supporting the entire process management of automotive electronics from R&D samples, design verification, reliability testing before mass production, to customer complaint tracking and lifespan estimation. We can provide experimental data, analysis results, and professional reports in both Chinese and English that meet international standards such as AEC-Q100/Q101/Q102/Q104/Q200, ISO 16750, and JEDEC, assisting customers in accelerating the introduction and obtaining certification from automotive manufacturers.
| Service Categories | Analysis/Testing | Can confirm/Can locate content | MA-tek provides technology |
|---|---|---|---|
| Automotive reliability and lifetime verification | Stability under high temperature, high humidity, power cycling, and thermal shock environments | Standard certification requirements before customer/automaker implementation | AEC-Q series testing, HTOL, TCT, HAST / uHAST, EDR, HTS, JEDEC |
| Thermal Behavior and Heat Dissipation Design Assessment of Power Modules | Thermal resistance, thermal distribution, material thermal fatigue and lifespan decline | IGBT / MOSFET / DC-DC module long-term operational reliability | IR thermal imaging, thermal field measurement, FEM thermal simulation, Power Cycling lifetime model |
| Packaging and solder joint fatigue/cavity analysis | solder interface, solder joint cracks, delamination and internal voids | Failure after packaging / Abnormality after going online / Customer complaint trace back | 3DX-Ray, C-SAM, Cross-section, FIB-TEM structural comparison and weakness localization |
| Material and Supply Chain Anomaly Determination | Coating, conductor, packaging material batch stability | Supplier Change / Dual Source Introduction / Material Revision | Comparison of material composition differences and establishment of consistency models for XPS, SIMS, and SEM-EDS. |