Chat with us, powered by LiveChat
Cooperation Column
12.02
2025

Energy-saving ferroelectric zirconium oxide in the theory and application of the energy field

The crystal structure characteristics of ferroelectric materials allow them to exhibit thermodynamic reversible interactions between electrical, thermal, and mechanical variables.

Cooperation Column
Energy-saving ferroelectric zirconium oxide in the theory and application of the energy field
Cooperation Column
10.28
2025

3D IC packaging: Development of heterogeneous bonding technology and process design assisted by in-situ heated atomic force microscopy.

Driven by AI and high-performance computing, 3D IC packaging has become a key factor in chip performance. Through in-situ atomic force microscopy (AFM) observation of the thermal expansion behavior of copper/SiO₂ embedded through holes, the research found that nanocrystalline copper can enhance the expansion by over 100%, significantly strengthening the process window and packaging reliability.

Cooperation Column
3D IC packaging: Development of heterogeneous bonding technology and process design assisted by in-situ heated atomic force microscopy.
Reliability Testing
09.19
2025

Insight into minute defects, safeguarding excellent quality - voids are no longer a problem, vacuum reflow soldering creates high reliability in SMT soldering quality.

In response to the market trend for high-reliability solder joints, MA-tek provides advanced SMT vacuum reflow soldering services, specifically designed for high-power and high-reliability electronic components, effectively reducing void rates and enhancing solder joint reliability.

Reliability Testing
Insight into minute defects, safeguarding excellent quality - voids are no longer a problem, vacuum reflow soldering creates high reliability in SMT soldering quality.
Reliability Testing
08.14
2025

AEC-Q006 2025 Edition Key Changes Full Analysis

AEC-Q006 is a reliability validation standard established by the Automotive Electronics Council, specifically for automotive electronic components that use copper wire as the interconnection material for chip packaging. The establishment of this standard is derived from the trend of copper wire gradually replacing traditional gold wire in packaging technology.

Reliability Testing
AEC-Q006 2025 Edition Key Changes Full Analysis
Cooperation Column
07.31
2025

Introduction to Electrostatic Discharge Protection Technology for Gallium Nitride Chips

Gallium Nitride (GaN) devices are rapidly gaining popularity in applications such as electric vehicles, power conversion, low Earth orbit satellites, and high-frequency communications, due to their high efficiency and high power characteristics. However, in these high-stress and high-reliability demanding environments, how to enhance electrostatic discharge (ESD) protection capability has become a key technical issue to ensure the stable operation of GaN chips.

Cooperation Column
Introduction to Electrostatic Discharge Protection Technology for Gallium Nitride Chips
Chemical Analysis
07.10
2025

K-kit - An innovative microchip for in-situ electron microscopy analysis of nano solutions.

This article introduces an innovative micro liquid pool chip "K-kit", which can quickly load solutions using capillary action, suitable for various TEM devices, and can enhance the contrast of nanoparticle images through wet negative staining. The K-kit has multiple unique product advantages and has been widely used in academic research and in the fields of electronics, chemicals, pharmaceuticals, food, and other industries for nano-solution analysis.

Chemical Analysis
K-kit - An innovative microchip for in-situ electron microscopy analysis of nano solutions.
Cooperation Column
06.17
2025

Silicon photonics technology: Opening the door to the future of high-speed optical communication.

Silicon photonics utilizes silicon materials to manufacture optical components, making them compatible with existing semiconductor processes, providing efficient, low-power, and mass-producible optical solutions.

Cooperation Column
Silicon photonics technology: Opening the door to the future of high-speed optical communication.
Reliability Testing
05.05
2025

Exploring the world of verification for automotive modules

Automotive modules are currently divided into two main categories in the AEC-Q verification family: Multichip Module (MCM) and Optoelectronic Multichip Module (OE-MCM).

Reliability Testing
Exploring the world of verification for automotive modules
Reliability Testing
05.01
2025

Quick Understanding of the Highlights of the 2025 Edition AQG 324 Specifications

AQG 324 is a testing guideline for automotive power modules led by ECPE (European Center for Power Electronics).

Reliability Testing
Quick Understanding of the Highlights of the 2025 Edition AQG 324 Specifications
Reliability Testing
04.28
2025

MA-tek establishes a service model for verifying the integrity of power components.

The high voltage and high frequency characteristics of power devices (SiC, GaN) related to power supply play a crucial role in electric vehicles. Due to the critical role of power devices in electric vehicles, many companies are seizing this trend and are actively investing in the research and development of power devices.

Reliability Testing
MA-tek establishes a service model for verifying the integrity of power components.

Privacy Preference Center

We use cookies to allow our website to function properly, personalize content and advertisements, provide social media features, and analyze traffic. We also share information about your usage of our website with social media, advertising, and analytics partners.

View Privacy Policy

Manage Consent Settings

Necessary Cookies

Always Enabled

The operation of the website relies on these cookies, and you cannot disable them in the system. These cookies are usually set based on the actions you take (i.e., service requests), such as setting privacy preferences, logging in, or filling out forms. You can configure your browser to block or prompt you about these cookies, but this may result in certain website functionalities not working.